IEEE MetroAgriFor 2019: Extended deadline for abstract submissions
2019 IEEE INTERNATIONAL WORKSHOP ON
Metrology for Agriculture and Forestry
Portici (Naples), October 24-26, 2019
Due to a high number of requests, the IEEE MetroAgriFor 2019 Organising Committee has agreed to extend the deadline for extended abstract submissions until June 28, 2019.
You are welcome to submit your extended-abstracts online at:
Authors guidelines are available at:
https://www.metroagrifor.org/initial-authors-instructions
Presentation
MetroAgriFor intends to create an active and stimulating forum where academics, researchers and industry experts in the field of measurement and data processing techniques for Agriculture, Forestry and Food can meet and share new advances and research results. Attention is paid, but not limited to, new technologies for agriculture and forestry environment monitoring, food quality monitoring, metrology-assisted production in agriculture, forestry and food industries, sensors and associated signal conditioning for agriculture and forestry, calibration methods for electronic test and measurement for environmental and food applications.
Besides invited lectures, presentations and poster sessions, the Workshop will feature a Short Course on Measurement Theory and Uncertainty and an Exhibition to offer leading manufacturers the opportunity to bring their latest technology solutions directly to the attention of a selected audience.
Call-for-papers
The Conference Program Committee is inviting Extended Abstracts (from 2 to 4 pages) for the MetroAgriFor 2019 Workshop, 24 – 26 October, 2019.
Interested researchers, academics, practitioners and industry partners are invited to submit extended abstracts for the Workshop. Papers that involve joint authorship with students, industry and community partners are encouraged. Early career researchers and research students are also encouraged to contribute papers.
Accepted papers in final version (maximum 6 pages) will be published in the proceedings of the Workshop and the proceedings will be submitted for indexing in the IEEE Xplore Digital Library.
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